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Kumada, Takayuki; Miura, Daisuke*; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Suzuki, Junichi*; Oku, Takayuki; Torikai, Naoya*; Niizeki, Tomotake*
Journal of Applied Crystallography, 55(5), p.1147 - 1153, 2022/10
Times Cited Count:1 Percentile:27.54(Chemistry, Multidisciplinary)Spin-contrast-variation neutron reflectivity obtains multiple reflectivity curves from a single sample and a single beam source. We used the strong point of the technique to reveal that, although methylated-perhydropolysilazane-derived silica layer has a higher porosity near the interface with acrylic urethane resin, the resin did not permeate the pore network.
Mizuki, Junichiro; Kimura, Hidekazu*
Oyo Butsuri, 68(11), p.1271 - 1274, 1999/11
no abstracts in English
Mizuki, Junichiro
Kagaku Kogyo, 49(7), p.33 - 41, 1998/07
no abstracts in English
Mizuki, Junichiro
Nihon Kessho Gakkai-Shi, 39(1), p.31 - 36, 1997/00
no abstracts in English
Kobayashi, Takuma*; Nakanuma, Takato*; Suzuki, Asato*; Sometani, Mitsuru*; Okamoto, Mitsuo*; Yoshigoe, Akitaka; Hosoi, Takuji*; Shimura, Takayoshi*; Watanabe, Heiji*
no journal, ,
We investigated the reliability of nitrided SiC MOS devices in terms of oxide leakage and flatband voltage stability. Although nitrided MOS devices on non-basal planes are known to have superior on-state performances, we found that the nitridation not only leads to pronounced oxide leakage but also hampers the flatband voltage stability in response to electron and hole injection. In the presentation, we will show how the nitridation modifies the MOS interfaces based on the results of synchrotron radiation X-ray photoelectron spectroscopy and discuss the possible cause of reliability degradation.